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Kaneko, Junichi; Yonezawa, Chushiro; Kasugai, Yoshimi; Sumiya, Hitoshi*; Nishitani, Takeo
Diamond and Related Materials, 9(12), p.2019 - 2023, 2000/12
Times Cited Count：9 Percentile：47.87(Materials Science, Multidisciplinary)no abstracts in English
Tamai, Hiroshi; Ogawa, Toshihide; Matsumoto, Hiroshi; Odajima, Kazuo; ; Hoshino, Katsumichi; Kasai, Satoshi; Kawakami, Tomohide; Kawashima, Hisato; Kondoh, Takashi; et al.
Japanese Journal of Applied Physics, 29(10), p.L1911 - L1914, 1990/10
Times Cited Count：1 Percentile：10.07(Physics, Applied)no abstracts in English
; Handa, Nuneo; Shiozawa, Kenichi; Hirata, Masaru; *
JAERI-M 90-062, 49 Pages, 1990/03
no abstracts in English
Handa, Nuneo; Hirata, Masaru; Shiozawa, Kenichi;
JAERI-M 90-015, 134 Pages, 1990/02
no abstracts in English
; ; ; Matsumoto, Hiroshi;
JAERI-M 86-143, 12 Pages, 1986/10
no abstracts in English
; ; *; ; ; Ohara, Yoshihiro; ; ; *; ; et al.
JAERI-M 8983, 17 Pages, 1980/08
no abstracts in English
; ; Sengoku, Seio
Japanese Journal of Applied Physics, 19(9), p.1737 - 1743, 1980/00
Times Cited Count：6 Percentile：34.8(Physics, Applied)no abstracts in English
; ; ;
Japanese Journal of Applied Physics, 19(8), p.1509 - 1514, 1980/00
Times Cited Count：3 Percentile：20.69(Physics, Applied)no abstracts in English
; ; ; ; ;
Journal of Nuclear Materials, 93-94, p.282 - 285, 1980/00
Times Cited Count：6 Percentile：58.22(Materials Science, Multidisciplinary)no abstracts in English
; ; ; ; ; ; ; ; Sengoku, Seio;
Journal of the Physical Society of Japan, 46(5), p.1635 - 1640, 1979/00
Times Cited Count：6no abstracts in English
; *; ; ; ; ; Sengoku, Seio; ; Seki, Masahiro;
JAERI-M 7287, 14 Pages, 1977/09
no abstracts in English
Sekine, Naoki; Eda, Takashi; Takasaki, Kazuyuki*; Kawasaki, Takahiro*; Inagawa, Takumu*; Kayano, Masashi
no journal, ,
Japan Atomic Energy Agency's Plutonium Fuel Development Center is considering introducing ICP-AES as a new method for analyzing the metal impurity content in MOX samples. The emission spectra of Pu and U, the main components of MOX samples, are extremely complex, resulting in continuous background increases and spectral interferences. Therefore, in order to accurately quantify the metal impurity elements in the MOX sample, it is necessary to remove Pu and U as a pretreatment for analysis. In this presentation, we will report on the outline and results of experiments related to this pretreatment.
